![Lens turret for a qucik and precise lense change]( "Lens turret for a qucik and precise lense change")
2026-09-24E-LIT: Thermography Test Bench Becomes Even More EfficientLens turret speeds up measurement processes; new microscope lenses availableRead onDownload ZIP-File (15420 kB)InfraTec’s modular, automated E-LIT test bench enables contactless and non-destructive testing of electronic and semiconductor components. Thanks to the new lens turret, measurements can now be performed even faster and more accurately. Its compact design – achieved by angling the axis of rotation – facilitates the positioning of contacts against the sample, as required for excitation in Lock-in Thermography
![InfraTec Thermografie-Anwenderkonferenz]( "InfraTec Thermografie-Anwenderkonferenz")
2026-09-17Online Event: Thermografie-Anwenderkonferenz „Forschung & Entwicklung“ (November 2026)Experience Thermography – Expert Presentations, Technology Demonstrations, and Professional ExchangeRead onDownload ZIP-File (5127 kB)Our free of charge “Thermografie-Awenderkonferenz” (thermography user conference) on November 5, 2026 provides a forum for professional exchange among users from academia and industry, with a particular focus on applications of thermography for demanding tasks in research and development.
![InfraTec Webinar AI Powered Thermal Data Processing]( "InfraTec Webinar AI Powered Thermal Data Processing")
2026-09-15Online Event: AI-powered Processing of Thermal DataTaking Data Processing, Machine Vision, and Industrial Quality Assurance to the Next LevelRead onDownload ZIP-File (12849 kB)On November 10, 2026, we invite you to join our free of charge online event, “AI-powered Thermal Data Processing”. Learn more about the use of artificial intelligence to extract and analyze valuable data from thermographic measurements.
![Webinar Lock-In Thermography]( "Online-Event: “Infrared Lock-in Thermography for Inspection of Electronics and Integrated Circuits”")
2026-09-10Online-Event: Lock-in Thermography for Inspection of Electronics and Integrated CircuitsDetecting thermal anomalies and local power losses within shortest test timesRead onDownload ZIP-File (11122 kB)Our free of charge InfraTec English online event "Infrared Lock-in Thermography for Inspection of Electronics and Integrated Circuits" will provide you with more information about lock-in thermography as a high-precision measurement method for non-contact and non-destructive testing in electronics and electrical engineering.
![hermography Provides Insights into Cost-Effective Steel Production for Press Hardening]( "Thermography Provides Insights into Cost-Effective Steel Production for Press Hardening")
2026-08-28Thermography Provides Insights into Cost-Effective Steel Production for Press HardeningResearch project advances robust industrial quenching-and-partitioning processesRead onDownload ZIP-File (1146 kB)As part of the IGF project “Manufacture of high-strength, ductile components from low-alloy quenched and tempered steel using novel quenching & partitioning press hardening strategies”, infrared thermography was used for process analysis and material characterization. The work focused on thermomechanical interactions during forming. Thermographic measurements were taken both during conventional heating processes (for example, furnace heating) and during innovative strategies such as contact heating.
